Measurement of surface alpha-acrivity of different samples with ion pulse ionization chamber

Date
Authors
Gavriljuk, Yu. M.
Gavrin, V. N.
Gangapshev, A. M.
Kazalov, V. V.
Kuzminov, V. V.
Panasenko, S. I.
Ratkevich, S. S.
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Abstract
Description
The construction of an ion pulse ionization chamber aimed at measuring ultra-low levels of surface alpha-activity of different samples is described. The results of measurement carried out with alpha-source and copper samples and light-reflecting film VM2000 are presented.
Comment: 6 pages, 7 postscript figures, talk at the XIV-th Int. School "Particles and Cosmology"
Keywords
Physics - Instrumentation and Detectors
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