Optical and structural properties of nanocrystalline copper oxide thin films prepared by activated reactive evaporation

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Date
2001
Authors
Balamurugan, B
Mehta, B R
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Abstract
Nanocrystalline Cu O thin films have been synthesized using an activated reactive evaporation technique.Structural and optical 2 characterizations of these films have been carried out using: glancing angle X-ray diffractometer; Fourier transform infrared spectrometer; transmission electron microscope; and UV-VIS-NIR spectrophotometer.The nanocrystallite size in these films was varied by varying deposition parameters.Optical studies show a direct allowed transition and a shift in the optical absorption edge from the bulk value with nanocrystallite size and stoichiometry of these films.These results show that single phase nanocrystalline Cu O thin films can be synthesized at a relatively low substrate temperature using the activated reactive evaporation 2 technique.These studies indicate that nanocrystallinity results in the stability of cubic Cu O phase in these films.
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Keywords
Cuprous oxide, Nanocrystalline thin films, Optical properties, Structural properties, X-Ray diffraction
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