The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

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Suszynski, Z.
Duer, R.
Kosikowski, M.
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Abstract
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This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence.
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Condensed Matter - Materials Science
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