GaGeTe Films as Phase-change Optical Recording Media

Thumbnail Image
Date
1995
Authors
Sripathi, Y
Malhotra, L K
Reddy, G B
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Ga20Ge30Te50 thin films deposited by vacuum evaporation on various substrates have been studied for their structural and optical properties. The as-deposited amorphous films were crystallized by thermally annealing them. The optical constants of the amorphous films indicate semiconducting behaviour (n > k). The optical bandgap (Eg) determined from Taut’s plot is 0.7 eV. The change in reflectance on crystallization has been utilized to obtain maximum optical contrast by optimising the thickness of the film.
Description
Keywords
Evaporation, Optical properties, Structural properties
Citation
Collections