Lifetime statistics in chaotic dielectric microresonators

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Schomerus, Henning
Wiersig, Jan
Main, Jörg
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Abstract
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We discuss the statistical properties of lifetimes of electromagnetic eigenmodes in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of anomalously short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance trapping phenomenon.
Comment: 7 pages, 5 figures
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Physics - Optics
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